The restart of the SENSOR+TEST, the leading trade fair for sensor and measurement technology, has been successful with the return to the face-to-face event with 371 exhibitors and around 4500 visitors and participants of the two congresses!
We would like to thank all customers, visitors and partners for visiting our booth and for the interest in our products.
Once again it has been shown that personal contact is the basis for good cooperation, especially for successfully launching and implementing projects together.
Many thanks to our colleague David Courtney for his presentation “LXI 1.6 Device Specification: It is all about security”at the Forum of SENSOR+TEST. (Learn more Kerberos and LXI related topics here.)
A big thankyou to all colleagues who worked behind the scenes to make our presence a great success.
A few impressions from our booth.
