Our application markets: Electronics industry
Electronics are becoming more complex. Digital protocols, analog signal paths and demanding test sequences meet strict quality requirements – and the need to ensure consistent functionality across variants, releases and hardware revisions. For developers, this means that reliable results must be available at an early stage – not only for initial functional testing, but also […]
RELEASE: TSEP POSEIDON SERVER UPDATES
We have released the new version 3.98.1 of our TSEP POSEIDON remote system. The new features concern the POSEIDON server. At TSEP, we regularly improve our software and hardware solutions in order to keep our products up to date and adapt them to our customers’ requirements. We are now announcing the following updates for our […]
Our application markets: Test&Measurement Industry
Manufacturers of test and measurement systems are under constant pressure to innovate. New measurement technology and standards must be integrated, platforms modernized and complex functions reliably implemented. Users expect precise results, simple operation and systems that remain usable in the long term. For development departments, this means keeping large software bases up to date, developing […]
Precise time synchronization with TSEP THEMIS according to IEEE 1588 PTP
Measurement technology poses numerous challenges today: Distributed measurement systems and complex synchronization processes make precise measurements difficult and limit the informative value in the overall context. Without a uniform, synchronized time base, measurement data cannot be used reliably for analyses and simulations. TSEP THEMIS CHRONOS offers innovative solutions that are based on established global standards […]
Which TSEP THEMIS Hardware Modules are suitable for your application?
The TSEP THEMIS modular system offers a selection of standardized enclosures, modules and cards. These can be adapted to different individual requirements. In addition, TSEP also develops customized enclosures, hardware modules and cards for specific test and measurement tasks. TSEP THEMIS standard enclosures The TSEP THEMIS standard enclosures include the desktop unit and the rack […]
Our TSEP THEMIS Software Modules – An Overview
The TSEP THEMIS modular system offers a selection of standardized, hardware-related and time-critical software components. They are available for various (real-time) operating systems such as Linux, Windows or RTOS and can be adapted to individual requirements. A brief overview: TSEP THEMIS Core is the central software on the THEMIS test and measurement devices, which bundles […]
FOS student completes internship at TSEP
We welcomed Lilly Heilmann as an intern for 6 months as part of her practical training at the Fachoberschule (FOS). At TSEP, she gained an insight into the work of an IT specialist in the company. The student herself tells us how she experienced her internship and what she took away from it: How did […]
TSEP anniversary: 20 years of hardware development
5 questions for the CEO and founder of TSEP, Peter Plazotta: TSEP has been developing and implementing customized T&M systems for over 30 years. This year marks a little anniversary: After being founded as an engineering office in 1988 and starting with software development in 2000, TSEP has now been active in the business field […]
RELEASE: TSEP KERBEROS APPLICATION AND CLIENT SOFTWARE UPDATES
We have released a new version of our KERBEROS software. The new features concern the TSEP KERBEROS Application (version 2.4.0) as well as the TSEP KERBEROS Client App and the Client Software for Windows (version 2.3.1). In order to keep our products up to date, TSEP regularly improves its software and hardware solutions. We are […]
SENSOR+TEST 2025 – VISIT TSEP
TSEP will be exhibiting at Sensor+Test 2025 from 6 – 8 May, 2025 in Nuremberg in Hall 1, Booth 1-345. At the trade fair, we will be presenting the latest generation of TSEP THEMIS, the modular and flexible T&M system. The measuring devices enable extremely agile and efficient development and optimization of test and measurement […]