{"id":139121,"date":"2026-09-24T09:36:15","date_gmt":"2026-09-24T07:36:15","guid":{"rendered":"https:\/\/tsep.com\/tsep-is-exhibiting-at-electronica-2026\/"},"modified":"2026-09-24T09:46:13","modified_gmt":"2026-09-24T07:46:13","slug":"tsep-is-exhibiting-at-electronica-2026","status":"publish","type":"post","link":"https:\/\/tsep.com\/en\/tsep-is-exhibiting-at-electronica-2026\/","title":{"rendered":"TSEP is exhibiting at electronica 2026"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"139121\" class=\"elementor elementor-139121 elementor-139098\" data-elementor-post-type=\"post\">\n\t\t\t\t<div class=\"elementor-element elementor-element-2cca3e0 e-flex e-con-boxed e-con e-parent\" data-id=\"2cca3e0\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-9d6aa44 elementor-widget elementor-widget-heading\" data-id=\"9d6aa44\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">Flexible, customer-specific solutions for modern test and measurement systems<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-09c20b2 elementor-widget elementor-widget-text-editor\" data-id=\"09c20b2\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>When? November 10-13, 2026 <\/strong><br><strong>Where? Hall A4, Booth 628 &#8211;  <\/strong><strong>Messe M\u00fcnchen<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-1e18983 elementor-widget elementor-widget-text-editor\" data-id=\"1e18983\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>TSEP will present its <strong>flexible, scalable test and measurement system, <a href=\"https:\/\/tsep.com\/en\/themis\/\">TSEP THEMIS<\/a><\/strong>, at electronica 2026. Together with the TSEP HERAKLES Test Bench, THEMIS forms a modular test platform for customer-specific T&#038;M systems. <\/p><p>Highlights at the trade show will include the integration of new technologies such as <strong>artificial intelligence<\/strong>, the new TSEP Trigger&#038;Sync solution, and the USB-TMC adapter, which converts existing USB ports on measuring instruments into high-performance USBTMC interfaces.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-8d529af e-flex e-con-boxed e-con e-parent\" data-id=\"8d529af\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-d7eedc1 elementor-widget elementor-widget-heading\" data-id=\"d7eedc1\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">TSEP THEMIS: Test and Measurement System<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-621d59a e-flex e-con-boxed e-con e-parent\" data-id=\"621d59a\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-bf68d8a elementor-widget elementor-widget-text-editor\" data-id=\"bf68d8a\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>By combining <strong>modular standard hardware, scalable architecture, and customizable expandability<\/strong>, TSEP THEMIS creates a future-proof foundation for test and measurement systems in a wide variety of applications. The TSEP THEMIS modular system combines standardized enclosures, modules, and cards. Thanks to its scalable architecture, it is possible to expand test capacities incrementally without the need for costly system replacements or new developments. The individual devices work together as an integrated unit.   <\/p><p>This results in flexible test systems that can be precisely adapted to different requirements \u2013 from compact setups to complex system landscapes.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-8253275 e-flex e-con-boxed e-con e-parent\" data-id=\"8253275\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-3b47c21 elementor-widget elementor-widget-heading\" data-id=\"3b47c21\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">TSEP HERAKLES: Software for Test and Measurement Procedures in Accordance with ISO 9000<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7b5afbc e-flex e-con-boxed e-con e-parent\" data-id=\"7b5afbc\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-2f15a99 elementor-widget elementor-widget-text-editor\" data-id=\"2f15a99\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>With TSEP HERAKLES, TSEP introduces a <strong>newly developed test bench<\/strong>. This powerful software enables the structured and audit-proof definition, editing, and execution of complex test and measurement processes. It simplifies the complete tracking of procedures in test environments at any time, the comprehensive documentation of changes, and the reproduction of results with minimal effort. Integrated status management ensures full transparency across all test processes \u2013 from planning to evaluation.   <\/p><p>With HERAKLES, both manual and automated tests can be performed within a unified environment. All test parameters and results are automatically and systematically stored in a database, resulting in complete documentation. The <strong>testing procedure is based on the requirements of ISO 9000<\/strong>, thereby ensuring a consistently traceable and audit-ready process structure.  <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-be9ca1c e-flex e-con-boxed e-con e-parent\" data-id=\"be9ca1c\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-4a5da18 elementor-widget elementor-widget-heading\" data-id=\"4a5da18\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">TSEP New Products: USBTMC Adapter and Trigger &amp; Sync Solution<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b2f8996 e-flex e-con-boxed e-con e-parent\" data-id=\"b2f8996\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-944118d elementor-widget elementor-widget-text-editor\" data-id=\"944118d\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Among the new developments that TSEP is presenting at electronica is the TSEP <strong>USBTMC adapter<\/strong>. It quickly and easily converts existing USB ports on measurement devices into high-performance USBTMC interfaces \u2013 without the need for custom development or high minimum order quantities. By utilizing the new <strong>FX5 microcontroller<\/strong>, the USBTMC adapter achieves significantly higher data rates and supports all common USB protocols up to USB 3.2. This makes the solution suitable for <strong>data-intensive applications<\/strong> where fast and stable communication is critical.   <\/p><p>TSEP\u2019s <strong>Trigger&#038;Sync solution<\/strong> ensures precise time synchronization in accordance with the <strong>IEEE 1588 standard<\/strong>. Time-based test and measurement systems enable the exploration of exciting new areas such as <strong>simulation and AI models<\/strong> (Artificial Intelligence). <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-59f0fbf e-flex e-con-boxed e-con e-parent\" data-id=\"59f0fbf\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-54773cf elementor-widget elementor-widget-heading\" data-id=\"54773cf\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h3 class=\"elementor-heading-title elementor-size-default\">Exhibits at electronica<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b6ad96e e-flex e-con-boxed e-con e-parent\" data-id=\"b6ad96e\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-b88111c elementor-widget elementor-widget-text-editor\" data-id=\"b88111c\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The <strong>TSEP THEMIS<\/strong> modular test platform for customer-specific test and measurement systems, in combination with <strong>TSEP HERAKLES<\/strong> and the <strong>Trigger&#038;Sync solution<\/strong>, will be showcased at the TSEP booth at electronica 2026.<\/p><p>In addition, the <strong>USBTMC adapter<\/strong> will be demonstrated in operation at the trade fair.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-df13650 e-flex e-con-boxed e-con e-parent\" data-id=\"df13650\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-b622f96 elementor-widget elementor-widget-image\" data-id=\"b622f96\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"800\" height=\"533\" src=\"https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-1024x682.jpg\" class=\"attachment-large size-large wp-image-12057\" alt=\"Testing\" srcset=\"https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-1024x682.jpg 1024w, https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-300x200.jpg 300w, https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-768x512.jpg 768w, https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-1536x1024.jpg 1536w, https:\/\/tsep.com\/wp-content\/uploads\/2024\/10\/TSEP-2024-09-People-014_v1-print-2048x1365.jpg 2048w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Flexible, customer-specific solutions for modern test and measurement systems When? November 10-13, 2026 Where? Hall A4, Booth 628 &#8211; Messe M\u00fcnchen TSEP will present its flexible, scalable test and measurement system, TSEP THEMIS, at electronica 2026. Together with the TSEP HERAKLES Test Bench, THEMIS forms a modular test platform for customer-specific T&#038;M systems. Highlights at [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":139120,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[1],"tags":[],"class_list":["post-139121","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-unkategorisiert"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>TSEP is exhibiting at electronica 2026 - Technical Software Engineering Plazotta GmbH<\/title>\n<meta name=\"description\" content=\"At electronica 2026, TSEP will showcase its flexible, scalable test and measurement system, TSEP THEMIS, as well as other new products.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/tsep.com\/en\/tsep-is-exhibiting-at-electronica-2026\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"TSEP is exhibiting at electronica 2026 - 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