TSEP at the SENSOR+TEST 2018

06. Juli 2018 | Fair

The leading international trade fair for sensor, measuring and testing technology opened its doors from 26 to 28 June under the motto “Welcome to the innovation dialogue!”. SENSOR + TEST is a fixed date in the appointment calendars of all user industries that require more and more sensors, measuring and testing systems for the development and production of their products. A total of almost 8,000 trade visitors took advantage of the opportunity to find out about the latest developments in sensor, measurement and testing technology at the 591 exhibitor stands and in the lecture forums.

We would like to thank you very much for visiting our booth. Thank you very much for your interest in our products and services!

TSEP has given 2 talks.

In addition to the extensive congress programs, the visitors also expected a large number of specialist presentations at the exhibitor forums in Halls 1 and 5. The exhibitors there offered an overview of their latest products and developments.

Wednesday, June 27, from 1:30 pm to 2:00 pm, Time synchronization with IEEE 1588 v2 and White Rabbit, Dipl. Ing. Peter Plazotta, CEO

The time synchronization over 1588 has been established as an IEEE standard since 2008 and is already used in various areas. Until now, the use of this standard has always been associated with exotic hardware. With the introduction of the Intel network chip families Intel I21x and Intel I35x, this standard is now available for the consumer market. During the presentation, possible application scenarios and their accuracy will be presented. In addition, the problems that can occur to achieve the required accuracy are shown. The CERN research institute has defined its own extension, the White Rabbit Standard, to improve the IEEE 1588 standard. During the presentation the extensions will be shown and the achievable accuracy will be discussed.

Thursday, June 28, from 11.30 am to 12.00 pm, The change in remote control from the central test computer to distrubted systems, Dipl. Ing. Jochen Wolle, Technical Consultant

Measuring instruments have been directly controlled by control computers for over 50 years. Here a star-shaped topology has established itself. Various standards for hardware (GPIB, RS-232, LAN, USB etc.) and software (SCPI, IVI, LabView) have been used for control. New concepts are now possible due to the spread of Ethernet and the associated standard. About 10 years ago, an American consortium created a standard (LXI) that defines the behavior of a measuring device on the Ethernet. Due to the widespread use of Ethernet in measurement technology and new standards (LXI and IEEE 1588), distributed and time-synchronous measurement devices are now possible. The presentation will show the new possibilities (distributed system, time-synchronized system) and will show the advantages by a realized example (runtime measurements of a satellite).

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